ARC TREATMENT DEVICE AND METHOD THEREFOR
An arc treatment device (14) comprises: a. An arc detection device (21) detecting an arc being present in a plasma chamber (30); b. An arc energy determination device (22) for determining an arc energy value which is a value corresponding to the energy supplied to the plasma chamber (30) while the a...
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| creator | LACH PIOTR ZELECHOWSKI MARCIN |
| description | An arc treatment device (14) comprises: a. An arc detection device (21) detecting an arc being present in a plasma chamber (30); b. An arc energy determination device (22) for determining an arc energy value which is a value corresponding to the energy supplied to the plasma chamber (30) while the arc is present in the plasma chamber (30); c. A break time determination device (24) for determining a break time from the determined arc energy value.
种电弧处理设备(14)包括：a.电弧检测设备(21)，其检测等离子体腔(30)中是否存在电弧；b.电弧能量确定设备(22)，其用于确定电弧能量值，所述电弧能量值是对应于当所述等离子体腔(30)中存在所述电弧时被供应到所述等离子体腔(30)的能量的值；c.切断时间确定设备(24)，其用于根据所确定的电弧能量值确定切断时间。 |
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种电弧处理设备(14)包括：a.电弧检测设备(21)，其检测等离子体腔(30)中是否存在电弧；b.电弧能量确定设备(22)，其用于确定电弧能量值，所述电弧能量值是对应于当所述等离子体腔(30)中存在所述电弧时被供应到所述等离子体腔(30)的能量的值；c.切断时间确定设备(24)，其用于根据所确定的电弧能量值确定切断时间。</description><language>chi ; eng</language><subject>BASIC ELECTRIC ELEMENTS ; ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS ; ELECTRICITY ; MEASURING ; MEASURING ELECTRIC VARIABLES ; MEASURING MAGNETIC VARIABLES ; PHYSICS ; TESTING</subject><creationdate>2017</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20171208&DB=EPODOC&CC=CN&NR=107454978A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25542,76290</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20171208&DB=EPODOC&CC=CN&NR=107454978A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>LACH PIOTR</creatorcontrib><creatorcontrib>ZELECHOWSKI MARCIN</creatorcontrib><title>ARC TREATMENT DEVICE AND METHOD THEREFOR</title><description>An arc treatment device (14) comprises: a. An arc detection device (21) detecting an arc being present in a plasma chamber (30); b. An arc energy determination device (22) for determining an arc energy value which is a value corresponding to the energy supplied to the plasma chamber (30) while the arc is present in the plasma chamber (30); c. A break time determination device (24) for determining a break time from the determined arc energy value.
种电弧处理设备(14)包括：a.电弧检测设备(21)，其检测等离子体腔(30)中是否存在电弧；b.电弧能量确定设备(22)，其用于确定电弧能量值，所述电弧能量值是对应于当所述等离子体腔(30)中存在所述电弧时被供应到所述等离子体腔(30)的能量的值；c.切断时间确定设备(24)，其用于根据所确定的电弧能量值确定切断时间。</description><subject>BASIC ELECTRIC ELEMENTS</subject><subject>ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS</subject><subject>ELECTRICITY</subject><subject>MEASURING</subject><subject>MEASURING ELECTRIC VARIABLES</subject><subject>MEASURING MAGNETIC VARIABLES</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2017</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZNBwDHJWCAlydQzxdfULUXBxDfN0dlVw9HNR8HUN8fB3UQjxcA1ydfMP4mFgTUvMKU7lhdLcDIpuriHOHrqpBfnxqcUFicmpeakl8c5-hgbmJqYmluYWjsbEqAEA8SYj9g</recordid><startdate>20171208</startdate><enddate>20171208</enddate><creator>LACH PIOTR</creator><creator>ZELECHOWSKI MARCIN</creator><scope>EVB</scope></search><sort><creationdate>20171208</creationdate><title>ARC TREATMENT DEVICE AND METHOD THEREFOR</title><author>LACH PIOTR ; ZELECHOWSKI MARCIN</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_CN107454978A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>chi ; eng</language><creationdate>2017</creationdate><topic>BASIC ELECTRIC ELEMENTS</topic><topic>ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS</topic><topic>ELECTRICITY</topic><topic>MEASURING</topic><topic>MEASURING ELECTRIC VARIABLES</topic><topic>MEASURING MAGNETIC VARIABLES</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>LACH PIOTR</creatorcontrib><creatorcontrib>ZELECHOWSKI MARCIN</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>LACH PIOTR</au><au>ZELECHOWSKI MARCIN</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>ARC TREATMENT DEVICE AND METHOD THEREFOR</title><date>2017-12-08</date><risdate>2017</risdate><abstract>An arc treatment device (14) comprises: a. An arc detection device (21) detecting an arc being present in a plasma chamber (30); b. An arc energy determination device (22) for determining an arc energy value which is a value corresponding to the energy supplied to the plasma chamber (30) while the arc is present in the plasma chamber (30); c. A break time determination device (24) for determining a break time from the determined arc energy value.
种电弧处理设备(14)包括：a.电弧检测设备(21)，其检测等离子体腔(30)中是否存在电弧；b.电弧能量确定设备(22)，其用于确定电弧能量值，所述电弧能量值是对应于当所述等离子体腔(30)中存在所述电弧时被供应到所述等离子体腔(30)的能量的值；c.切断时间确定设备(24)，其用于根据所确定的电弧能量值确定切断时间。</abstract><oa>free_for_read</oa></addata></record> |
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| subjects | BASIC ELECTRIC ELEMENTS ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS ELECTRICITY MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING |
| title | ARC TREATMENT DEVICE AND METHOD THEREFOR |
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