SCANNING PROBE MICROSCOPE AND METHOD FOR MEASURING LOCAL ELECTRICAL POTENTIAL FIELDS

The invention relates to a scanning probe microscope and a method for measuring local electrical potential fields. According to the invention, a scanning probe microscope is provided, on the tip of which a quantum dot is applied. This permits an increase in the resolution and sensitivity in the meas...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	WAGNER CHRISTIAN, TEMIROV RUSLAN, TAUTZ FRANK STEFAN, GREEN MATTHEW FELIX BLISHEN
Format:	Patent
Sprache:	chi ; eng
Schlagworte:	APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBEMICROSCOPY [SPM] MEASURING PHYSICS SCANNING-PROBE TECHNIQUES OR APPARATUS TESTING
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