Electronic inspection method based on data analysis

The invention discloses an electronic inspection method based on data analysis. The method comprises steps that firstly, an electronic inspection system is constructed; a table structure is dynamically generated in the electronic inspection system; early warning events are added to the electronic in...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	CHEN YANSHENG, GU HAISHENG
Format:	Patent
Sprache:	chi ; eng
Schlagworte:	CALCULATING COMPUTING COUNTING DATA PROCESSING SYSTEMS OR METHODS, SPECIALLY ADAPTED FORADMINISTRATIVE, COMMERCIAL, FINANCIAL, MANAGERIAL, SUPERVISORYOR FORECASTING PURPOSES ELECTRIC DIGITAL DATA PROCESSING PHYSICS SYSTEMS OR METHODS SPECIALLY ADAPTED FOR ADMINISTRATIVE,COMMERCIAL, FINANCIAL, MANAGERIAL, SUPERVISORY OR FORECASTINGPURPOSES, NOT OTHERWISE PROVIDED FOR
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