Electronic inspection method based on data analysis

The invention discloses an electronic inspection method based on data analysis. The method comprises steps that firstly, an electronic inspection system is constructed; a table structure is dynamically generated in the electronic inspection system; early warning events are added to the electronic in...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser:	CHEN YANSHENG, GU HAISHENG
Format:	Patent
Sprache:	chi ; eng
Schlagworte:	CALCULATING COMPUTING COUNTING DATA PROCESSING SYSTEMS OR METHODS, SPECIALLY ADAPTED FORADMINISTRATIVE, COMMERCIAL, FINANCIAL, MANAGERIAL, SUPERVISORYOR FORECASTING PURPOSES ELECTRIC DIGITAL DATA PROCESSING PHYSICS SYSTEMS OR METHODS SPECIALLY ADAPTED FOR ADMINISTRATIVE,COMMERCIAL, FINANCIAL, MANAGERIAL, SUPERVISORY OR FORECASTINGPURPOSES, NOT OTHERWISE PROVIDED FOR
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Beschreibung
Zusammenfassung:	The invention discloses an electronic inspection method based on data analysis. The method comprises steps that firstly, an electronic inspection system is constructed; a table structure is dynamically generated in the electronic inspection system; early warning events are added to the electronic inspection system and are used for providing prompting for data violating rules when various data are filled into tables; in the electronic inspection system, dynamic splicing of a static page and script events is carried out according to the generated table structure information and the early warning operation information; the inspection information is filled into the electronic inspection system, the inspection information is analyzed by the system, and the analysis result is displayed on the static page. Compared with the prior art, inspection work efficiency is substantially improved, standardized, process-oriented and intelligent inspection work is realized, manual audit workload is substantially reduced, acquis