Abnormality Measuring Method And Abnormality Measuring Apparatus
An abnormality measuring method and an abnormality measuring apparatus of equipment are provided. The abnormality measuring method includes the following steps: acquiring a feature sequence corresponding to a life cycle according to recipe information and sensing information, wherein the feature seq...
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Format: | Patent |
Sprache: | chi ; eng |
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Zusammenfassung: | An abnormality measuring method and an abnormality measuring apparatus of equipment are provided. The abnormality measuring method includes the following steps: acquiring a feature sequence corresponding to a life cycle according to recipe information and sensing information, wherein the feature sequence includes a plurality of feature subset sequences, and the life cycle is relative to a plurality of process runs; performing repeatedly a life segment analyzing process to acquire a plurality of life segments of the life cycle and each of the plurality of the feature subset sequences corresponding to one of the plurality of life segments; building a corresponding trending distribution of each of the plurality of life segments according to a corresponding feature subset sequence of the life segment; and determining whether to send an alarm message according to a plurality of trending distributions.
本发明提供了种设备的异常评估方法,包括下列步骤。根据配方信息与传感信号,取得对应于生命周期的特征序列,特征序列包括多个特征子集序列,生命周期关联于多个工艺操作。对生命周期重复执行生命区段分析程序,以取得生命周期中的多个生命区段, |
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