Detection method of nano crystals formed on surface of 7050 aluminum alloy

The invention discloses a detection method of nano crystals formed on the surface of 7050 aluminum alloy. The detection method comprises the following steps: preparing multiple 7050 alloy samples, subjecting the alloy samples to extreme plastic deformation under a same technology and different techn...

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Bibliographische Detailangaben
Hauptverfasser: CHEN HAOTIAN, CAO YUPENG, WANG HENG, DAI LIXIN, CHEN YIPING, ZHOU RUI, HUA GUORAN, ZHANG LIHU, JIANG SUZHOU, ZHU MINRUI
Format: Patent
Sprache:chi ; eng
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Zusammenfassung:The invention discloses a detection method of nano crystals formed on the surface of 7050 aluminum alloy. The detection method comprises the following steps: preparing multiple 7050 alloy samples, subjecting the alloy samples to extreme plastic deformation under a same technology and different technological parameters; obtaining X ray diffraction patterns through X ray diffraction; drawing a curve representing the relationship between the half-width of a same specific diffraction crystal face and the technological parameters; finding a growth inflection point in the curve, testifying the technological parameter of the extreme plastic deformation corresponding to the growth inflection point is the minimal technological parameter of nano crystals formed on the surface of 7050 aluminum alloy through a transmission electron microscope (TEM) and an electron diffraction experiment; drawing a curve representing the relationship between the half-width of a same non-specific diffraction crystal face and power density,