Thin film thermal conductivity measuring system based on micro-nano fluorescent particles
The invention provides a thin film thermal conductivity measuring system based on micro-nano fluorescent particles. The measuring system at least comprises a sample structure module, an imaging light path module and a laser emission and spectrum measurement module. The sample structure module at lea...
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| creator | ZHANG WUKANG FANG XIAOHONG LI DONGDONG CHEN XIAOYUAN CHEN HAIYAN |
| description | The invention provides a thin film thermal conductivity measuring system based on micro-nano fluorescent particles. The measuring system at least comprises a sample structure module, an imaging light path module and a laser emission and spectrum measurement module. The sample structure module at least comprises a substrate, a to-be-measured thin film, an absorption heat source and the micro-nano fluorescent particles; the to-be-measured thin film is arranged on the substrate, and the absorption heat source and the micro-nano fluorescent particles are placed on the surface of the to-be-measured thin film; or the micro-nano fluorescent particles are directly placed on the substrate; the laser emission and spectrum measurement module is arranged above the sample structure module and used for irradiating the to-be-measured thin film so that the absorption heat source can absorb laser energy to generate heat, meanwhile, the micro-nano fluorescent particles are excited by lasers to generate fluorescence, and the sp |
| format | Patent |
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The measuring system at least comprises a sample structure module, an imaging light path module and a laser emission and spectrum measurement module. 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The sample structure module at least comprises a substrate, a to-be-measured thin film, an absorption heat source and the micro-nano fluorescent particles; the to-be-measured thin film is arranged on the substrate, and the absorption heat source and the micro-nano fluorescent particles are placed on the surface of the to-be-measured thin film; or the micro-nano fluorescent particles are directly placed on the substrate; the laser emission and spectrum measurement module is arranged above the sample structure module and used for irradiating the to-be-measured thin film so that the absorption heat source can absorb laser energy to generate heat, meanwhile, the micro-nano fluorescent particles are excited by lasers to generate fluorescence, and the sp</description><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</subject><subject>MEASURING</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2017</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNqNyrEKwkAMANAuDqL-Q_yAgsWqOEpRnJy6OJV4TdvAXa5cUqF_r4Mf4PSWt8ye9cACHfsANlAK6MFFaSdn_GabIRDqlFh60FmNArxQqYUoENilmAtKhM5PMZE6EoMRk7HzpOts0aFX2vxcZdvbta7uOY2xIR3x28ma6lHsTkVZHs7Hy_6f8wFHxjuH</recordid><startdate>20170908</startdate><enddate>20170908</enddate><creator>ZHANG WUKANG</creator><creator>FANG XIAOHONG</creator><creator>LI DONGDONG</creator><creator>CHEN XIAOYUAN</creator><creator>CHEN HAIYAN</creator><scope>EVB</scope></search><sort><creationdate>20170908</creationdate><title>Thin film thermal conductivity measuring system based on micro-nano fluorescent particles</title><author>ZHANG WUKANG ; FANG XIAOHONG ; LI DONGDONG ; CHEN XIAOYUAN ; CHEN HAIYAN</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_CN107144596A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>chi ; eng</language><creationdate>2017</creationdate><topic>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</topic><topic>MEASURING</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>ZHANG WUKANG</creatorcontrib><creatorcontrib>FANG XIAOHONG</creatorcontrib><creatorcontrib>LI DONGDONG</creatorcontrib><creatorcontrib>CHEN XIAOYUAN</creatorcontrib><creatorcontrib>CHEN HAIYAN</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>ZHANG WUKANG</au><au>FANG XIAOHONG</au><au>LI DONGDONG</au><au>CHEN XIAOYUAN</au><au>CHEN HAIYAN</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Thin film thermal conductivity measuring system based on micro-nano fluorescent particles</title><date>2017-09-08</date><risdate>2017</risdate><abstract>The invention provides a thin film thermal conductivity measuring system based on micro-nano fluorescent particles. 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| language | chi ; eng |
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| subjects | INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS TESTING |
| title | Thin film thermal conductivity measuring system based on micro-nano fluorescent particles |
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