Thin film thermal conductivity measuring system based on micro-nano fluorescent particles

The invention provides a thin film thermal conductivity measuring system based on micro-nano fluorescent particles. The measuring system at least comprises a sample structure module, an imaging light path module and a laser emission and spectrum measurement module. The sample structure module at least comprises a substrate, a to-be-measured thin film, an absorption heat source and the micro-nano fluorescent particles; the to-be-measured thin film is arranged on the substrate, and the absorption heat source and the micro-nano fluorescent particles are placed on the surface of the to-be-measured thin film; or the micro-nano fluorescent particles are directly placed on the substrate; the laser emission and spectrum measurement module is arranged above the sample structure module and used for irradiating the to-be-measured thin film so that the absorption heat source can absorb laser energy to generate heat, meanwhile, the micro-nano fluorescent particles are excited by lasers to generate fluorescence, and the sp