Scattering parameter test circuit and method suitable for long delay device

The invention discloses a scattering parameter test circuit and method suitable for a long delay device, and belongs to the technical field of microwave test. The test circuit and method can realize accurate test of delay characteristics of the long delay device under any test scanning and analysis...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	GUO MIN, WANG ZUNFENG
Format:	Patent
Sprache:	chi ; eng
Schlagworte:	MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING
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