Wavefront measurement-based target object depth information acquisition method
The invention discloses a wavefront measurement-based target object depth information acquisition method. The method uses a wavefront measurement device to measure the wavefront information of target object point radiation spherical waves, and then the sphere center of the spherical waves is calcula...
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Format: | Patent |
Sprache: | chi ; eng |
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Zusammenfassung: | The invention discloses a wavefront measurement-based target object depth information acquisition method. The method uses a wavefront measurement device to measure the wavefront information of target object point radiation spherical waves, and then the sphere center of the spherical waves is calculated according to wavefront, and thus, the space position of the target object point is obtained. As the space target object can be regarded to be formed by discrete matter points one by one, when the wavefront measurement device completes position calculation on all target object points, the depth information of the whole space target object can be acquired. The method adopts a wavefront measurement method in physical optics to acquire the depth information of the target object, the complicated traditional geometric optics and projective geometric calculation methods are got rid of, and a foundation is laid for digital holographic recording and display of the space target object.
本发明公开了种基于波前测量的目标物深度信息获取方法,该方法使用波前测量 |
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