Photosensitive chip testing device

The present invention relates to the technical field of chip testing and particularly relates to a photosensitive chip testing device. The device comprises an upper cover, a base and a clamping hook. During the test on a photosensitive chip, the photosensitive chip is placed in a chip groove and then the upper cover and the base are clamped together through the clamping hook. After the clamping operation, a first sealing protrusion and a first sealing groove are matched to form a first sealing part. In addition, a triggering part abuts against the photosensitive chip inside the chip groove, so that a probe is compressed by the photosensitive chip to form a test loop. The device is simple in test operation, easy in production and low in cost. Due to the arrangement of the first sealing protrusion and the first sealing groove, the light emitted from a light source is prevented from leaking to the outside. The interference of the external light on the test is eliminated. The test accuracy is improved. 本发明涉及芯片测试技