Method for drawing working curve of silicon-aluminum-calcium-magnesium-manganese-vanadium-chromium in to-be-detected high titanium slag sample and determining contents of silicon-aluminum-calcium-magnesium-manganese-vanadium-chromium in to-be-detected high titanium slag sample
The invention discloses a method for drawing a working curve of silicon-aluminum-calcium-magnesium-manganese-vanadium-chromium in a to-be-detected high titanium slag sample and determining the contents of the silicon-aluminum-calcium-magnesium-manganese-vanadium-chromium in the to-be-detected high t...
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Format: | Patent |
Sprache: | chi ; eng |
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Zusammenfassung: | The invention discloses a method for drawing a working curve of silicon-aluminum-calcium-magnesium-manganese-vanadium-chromium in a to-be-detected high titanium slag sample and determining the contents of the silicon-aluminum-calcium-magnesium-manganese-vanadium-chromium in the to-be-detected high titanium slag sample. The method for drawing the working curve of the silicon-aluminum-calcium-magnesium-manganese-vanadium-chromium in the to-be-detected high titanium slag sample by an ICP-AES (Inductively Coupled Plasma-Atomic Emission Spectrometry) method comprises the following steps: firstly, carrying out melting treatment and dissolving leaching treatment on the to-be-detected high titanium slag sample in sequence so as to obtain a matrix solution by preparation; secondly, preparing one group of working curve standard solution by using a silicon-aluminum-calcium-magnesium-manganese-vanadium-chromium standard solution and the matrix solution; thirdly, based on the group of working curve standard solution, draw |
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