Fault testing method based on binary tree

The invention discloses a fault testing method based on a binary tree. By means of normal skipping and fault skipping, fault obviation operation can be reduced. Under the condition that the test result/state data of one node is foreknown, the node can be skipped, and therefore user's operation...

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Bibliographische Detailangaben
Hauptverfasser: CAO XINKUAN, HE PEI, DUAN YANPENG
Format: Patent
Sprache:chi ; eng
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Beschreibung
Zusammenfassung:The invention discloses a fault testing method based on a binary tree. By means of normal skipping and fault skipping, fault obviation operation can be reduced. Under the condition that the test result/state data of one node is foreknown, the node can be skipped, and therefore user's operation is simplified, through the last step operation, operation of one node can be repeated, the test result is subject to the last time result, and therefore interference, on the fault obviation result, caused by that the test state is not stable and other factors is eliminated. 本发明公开了种基于二叉树的故障测试方法,该方法通过"正常跳过"、"故障跳过",减少了排故的操作。在预知某节点的测试结果/状态数据的情况下,可跳过该节点,从而精简了用户的操作。通过"上步"操作,可重复进行某个节点的操作,测试结果以最后次为准,从而排除了由于试验状态不稳定等因素对排故结果产生的干扰。