Intelligent examination paper look-over method and system
The invention discloses an intelligent examination paper look-over method and system. The method comprises the following steps: step 1, reading an examination paper code of a jth test question in an ith student login information list; step 2, reading and judging whether an input answer is same with...
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Format: | Patent |
Sprache: | chi ; eng |
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Zusammenfassung: | The invention discloses an intelligent examination paper look-over method and system. The method comprises the following steps: step 1, reading an examination paper code of a jth test question in an ith student login information list; step 2, reading and judging whether an input answer is same with a reference answer or not; step 3, if the input answer is the same with the reference answer, returning to score; if the input answer is different from the reference answer, testing the input answer; and step 4, feeding back the look-over results, ending examination paper look-cover, and generating electronic examination paper and look-over record archival information. According to the examination paper look-over and system disclosed by the invention, intelligent look-over for subjective questions and objective questions can be realized, the examination paper look-over period is greatly shortened, manpower and material resources are saved, and the wrong look-over condition which is liable to appear during manual ex |
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