D flip-flop hold time measuring circuit and measuring method

The invention provides a D flip-flop hold time measuring circuit and measuring method. The D flip-flop hold time measuring circuit comprises an input unit, a converting unit and an output unit. The D flip-flop hold time measuring circuit also comprises a variable voltage source, which is used for ap...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	HE HONGKAI, LIAO CHUNHE, ZHU MIN
Format:	Patent
Sprache:	chi ; eng
Schlagworte:	MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING
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