Lithography apparatus and method of manufacturing a device

An immersion lithography apparatus has a controller (500) configured to control a substrate table (WT) to move along an exposure route including in order: an entry motion (R2) in which the substrate moves from an off-substrate position at which the immersion space (10) does not overlap the substrate...

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Hauptverfasser: KOX RONALD FRANK, DE GROOT CASPER RODERIK, CUSTERS ROLF HENDRIKUS JACOBUS, GUNTER PIETER LEIN JOSEPH, BLANCO CARBALLO VICTOR MANUEL, VAN DE VIJVER YURI JOHANNES GABRI L, SCHOLTEN BERT DIRK, EUMMELEN ERIK HENRICUS EGIDIUS CATHARINA, PHILLIPS DAVID MERRITT, WOUTERS MARIJN, VIEYRA SALAS JORGE ALBERTO, VAN DEN NIEUWELAAR NORBERTUS JOSEPHUS MARTINUS, VAN DER ZANDEN FREDERIK ANTONIUS
Format: Patent
Sprache:chi ; eng
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Zusammenfassung:An immersion lithography apparatus has a controller (500) configured to control a substrate table (WT) to move along an exposure route including in order: an entry motion (R2) in which the substrate moves from an off-substrate position at which the immersion space (10) does not overlap the substrate (W) to an on-substrate position at which the immersion space at least partially overlaps the substrate, a transfer motion (R3, R4) in which the substrate table changes speed and/or direction and moves for at least a transfer time after the substrate moves to the on-substrate position, and an expose motion in which the substrate is scanned and the patterned beam is projected onto the substrate, wherein throughout the transfer motion at least a part of the immersion space overlaps the substrate and wherein the patterned bean is not projected onto the substrate during the entry motion and the transfer motion. 种浸没式光刻设备具有控制器(500),所述控制器(500)被配置用以控制衬底台(WT)沿着曝光路线移动,所述曝光路线按次序包括:进入运动(R2),其中衬底从浸没空间(10)不与所述衬底重叠的衬底外位置移动至所述浸没空间