Test circuit for generating direct-current superimposed impulse voltage

The present invention discloses a test circuit for generating direct-current superimposed impulse voltage. The test circuit includes a second resistor, an impulse voltage generator and a direct-current generator; the second resistor is connected in series with a test product, so that a test loop can be formed; and the impulse voltage generator is connected in parallel with a modulation circuit used for adjusting attenuation shock waves. The test circuit can provide circuit hardware support for capacitor insulation performance testing. 本发明公开了种产生直流叠加冲击电压的试验电路，包括用于与测试品串联构成测试回路的第二电阻、冲击电压发生器和直流电压发生器，在冲击电压发生器上并联有用于调节衰减震荡波的调制电路，其为电容绝缘性能测试提供电路硬件支撑。