On-site undisturbed sample structure for seepage deformation test and preparation method of on-site undisturbed sample structure

The invention relates to an on-site undisturbed sample structure for seepage deformation tests and a preparation method of the on-site undisturbed sample structure, and aims to confirm the size of a test sample by combining specific sizes, orientation and seepage properties of a structural surface o...

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Bibliographische Detailangaben
Hauptverfasser: RAO MENG, FAN HONGSHEN, WANG JUN, SUN YANQIN, LI XINYI, WU JIHUI, CHEN BIAO, ZHU XIAOCAI, XU GAOFENG, JIN ZHONGLIANG, YI SHENZHOU
Format: Patent
Sprache:chi ; eng
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Beschreibung
Zusammenfassung:The invention relates to an on-site undisturbed sample structure for seepage deformation tests and a preparation method of the on-site undisturbed sample structure, and aims to confirm the size of a test sample by combining specific sizes, orientation and seepage properties of a structural surface of a testing point, and comprehensive data such as the water supply capacity of the testing point, instrument mounting, construction convenience and; an undisturbed sample comprises a complete rock mass structure surface, a low-angle dip interlayer staggered zone is in a height direction, a high dip angle fault is in a width direction, and at least a complete undisturbed fracture zone of which the thickness is not less than 20cm is retained. According to the technical scheme of the invention, the on-site undisturbed sample structure is a cuboid, wherein a test sample with an interlayer staggered zone is arranged in the middle of the cuboid; a water inlet cabin and a water outlet cabin are arranged in a seepage path