Semiconductor device tester with DUT data streaming

A method is described that includes configuring multiple test units of a semiconductor device tester with respective information indicating corresponding storage space within either or both of an off load processing unit and central control unit of the tester. The method further includes streaming DUT data from the test units to their respective storage space within at least one of the off load processing unit and the central control unit such that the test units continually initiate the sending of their corresponding DUT data to their corresponding storage space. 本文描述的方法包括用相应的信息配置半导体器件测试器的多个测试单元，其中相应的信息指示该测试器的卸载处理单元和中央控制单元中的者或二者内的相应存储空间。方法还包括从测试单元向它们在卸载处理单元和中央控制单元中的至少者内的相应存储空间流送DUT数据，以使得测试单元持续地向它们的相应存储空间发起对它们相应DUT数据的传送。