Height gauge
The invention relates to the field of a mechanical surveying and mapping instrument and especially relates to a height gauge. The height gauge comprises a base and a main ruler fixedly arranged on the base. The main ruler is movably provided with a vernier scale. The height gauge also comprises an a...
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| Format: | Patent |
| Sprache: | chi ; eng |
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| Zusammenfassung: | The invention relates to the field of a mechanical surveying and mapping instrument and especially relates to a height gauge. The height gauge comprises a base and a main ruler fixedly arranged on the base. The main ruler is movably provided with a vernier scale. The height gauge also comprises an assistant ruler in relative movement cooperation with the main ruler. The assistant ruler is provided with assistant ruler graduations. The vernier scale is provided with assistant ruler vernier graduations corresponding to the assistant ruler graduations. The height gauge also comprises a locking member for locking and fixing the assistant ruler and the main ruler, and a reference member arranged fixedly with respect to the assistant ruler. The reference member is provided with a reference surface. When the end surface of the vernier scale is closely fit to the reference surface, the assistant ruler graduations can realize zero alignment with the assistant ruler vernier graduations. When the height gauge is used, t |
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