Method of selectively etching metal layer from microstructure
The invention relates to a method of etching a portion of a metal layer of a microstructure comprised of the metal layer disposed on a transparent conducting oxide (TCO) layer, and in particular, to selectively etching the portion of the metal layer and not the TCO layer. 本发明涉及蚀刻微观结构的金属层的部分的方法,该微观结构...
Gespeichert in:
1. Verfasser: | |
---|---|
Format: | Patent |
Sprache: | chi ; eng |
Schlagworte: | |
Online-Zugang: | Volltext bestellen |
Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
Zusammenfassung: | The invention relates to a method of etching a portion of a metal layer of a microstructure comprised of the metal layer disposed on a transparent conducting oxide (TCO) layer, and in particular, to selectively etching the portion of the metal layer and not the TCO layer.
本发明涉及蚀刻微观结构的金属层的部分的方法,该微观结构由设置在透明导电氧化物(TCO)层上的金属层构成,并且具体地涉及选择性地蚀刻金属层的部分并且不蚀刻TCO层。 |
---|