Lithographic apparatus and method

A method of modifying a lithographic apparatus comprising an illumination system for providing a radiation beam, a support structure for supporting a patterning device to impart the radiation beam with a pattern in its cross-section, a first lens for projecting the radiation beam at the patterning d...

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Bibliographische Detailangaben
Hauptverfasser: VAN BUSSEL HUBERTUS PETRUS LEONARDUS HENRICA, KERSSEMAKERS SANDER, VAN BALLEGOIJ ROBERTUS NICODEMUS JACOBUS, BASELMANS JOHANNES JACOBUS MATHEUS, BUTLER HANS, HOOGENDAM CHRISTIAAN ALEXANDER, SMEETS BART
Format: Patent
Sprache:chi ; eng
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Zusammenfassung:A method of modifying a lithographic apparatus comprising an illumination system for providing a radiation beam, a support structure for supporting a patterning device to impart the radiation beam with a pattern in its cross-section, a first lens for projecting the radiation beam at the patterning device with a first magnification, a substrate table for holding a substrate, and a first projection system for projecting the patterned radiation beam at a target portion of the substrate with a second magnification is disclosed. The first lens and the first projection system together provide a third magnification. The method comprises reducing by a first factor the first magnification to provide a second lens for projecting the radiation beam with a fourth magnification; and increasing by the first factor the second magnification to provide a second projection system for projecting the patterned radiation beam at the target portion of the substrate with a fifth magnification. 种修改光刻设备的方法,光刻设备包括用于提供辐射束的照射系统,用于支撑图案化装