Sampling method and device

The invention discloses a sampling method and device. The method comprises the following steps of: obtaining the practical environment temperature, which is collected by a temperature sensor, of a processor; judging whether the difference value of the practical environment temperature and calibratio...

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Hauptverfasser: KANG YING, GAO LONGJI, JIANG YUHONG, CHANG LIANG, CHANG HONGQI, ZHANG JIAN, HOU HONGMIN, XUE LIMIN, LI HUIYONG, ZHAO CHANGBING, ZHANG SIYONG, HAO LIPENG, OUYANG QIANG, WANG JINGREN, LIU XINGCHANG, LI ZENGLI, LI LIXIA
Format: Patent
Sprache:chi ; eng
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Zusammenfassung:The invention discloses a sampling method and device. The method comprises the following steps of: obtaining the practical environment temperature, which is collected by a temperature sensor, of a processor; judging whether the difference value of the practical environment temperature and calibration temperature exceeds a preset difference value range or not; and if the difference value exceeds the preset difference value range, compensating the current sampling signal of the processor according to a compensation coefficient corresponding to the difference value. By use of sampling method, the technical problem that a sampling method in the prior art is low in sampling accuracy due to the change of the environment temperature is solved. 本发明公开了种采样方法和装置。其中,该方法包括:获取温度传感器采集到的处理器所处的实际环境温度;判断实际环境温度与校准温度的差值是否超出预设差值范围;如果差值超出预设差值范围,则根据差值对应的补偿系数对处理器当前的采样信号进行补偿。本发明解决了现有技术中的采样方法由于环境温度的变化所导致的采样精度较低的技术问题。