Service life assessment method for ultra-high voltage grid GIS housing containing defects

The invention discloses a service life assessment method for an ultra-high voltage grid GIS housing containing defects. Currently, a dedicated method for assessment on safety and service life of a GIS housing containing defects still lacks. The method comprises structural data acquisition of the ult...

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Hauptverfasser: CHEN BINGBING, ZHOU YANGYANG, ZHANG JIE, ZHOU ZHENGQIANG, ZHAO ZHOUFENG, SUN QINGFENG, WU YIFENG, LUO HONGJIAN, WANG JIONGGENG, TANG XIATAO, FU DAHONG, QIAO MIN, MEI JIAN, ZHENG SANLONG, YAO HUI, CHEN YINZHEN, YU PEIXIANG
Format: Patent
Sprache:chi ; eng
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Zusammenfassung:The invention discloses a service life assessment method for an ultra-high voltage grid GIS housing containing defects. Currently, a dedicated method for assessment on safety and service life of a GIS housing containing defects still lacks. The method comprises structural data acquisition of the ultra-high voltage grid GIS housing, defect feature acquisition of the ultra-high voltage grid GIS housing, defect expanding limit determination of the ultra-high voltage grid GIS housing, material and welded seam performance acquisition of the ultra-high voltage grid GIS housing, fatigue crack extended model establishment of the ultra-high voltage grid GIS housing, monitoring and extraction of working condition feature parameters of the ultra-high voltage grid GIS housing, and fatigue cycle number calculation of the ultra-high voltage grid GIS housing. Structure, defects, material performance and alternating working condition load of the ultra-high voltage grid GIS housing are taken into comprehensive account, and de