Dynamic fault tree analysis method based on improved sequential binary decision diagram
The invention discloses a dynamic fault tree analysis method based on an improved sequential binary decision diagram (SBDD), relates to a dynamic fault tree analysis method based on Pandora, and belongs to the technical field of data processing. According to the method, global sequencing is performe...
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Format: | Patent |
Sprache: | chi ; eng |
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Zusammenfassung: | The invention discloses a dynamic fault tree analysis method based on an improved sequential binary decision diagram (SBDD), relates to a dynamic fault tree analysis method based on Pandora, and belongs to the technical field of data processing. According to the method, global sequencing is performed on bottom events of a fault tree in consideration with a relation of the bottom events, and invalid nodes of the SBDD tree are dynamically deleted in an extended SBDD algorithm based on the global sequencing of the bottom events and the relation between dynamic bottom events and static bottom events to eliminate invalid branches, so that the dynamic fault tree based on Pandora can be effectively converted into the SBDD, less SBDDs are generated, an invalid cut set does not exit, and qualitative analysis and quantitative analysis of the fault tree are more accurate.
本发明公开了种基于改进序列二元决策图的动态故障树分析方法,涉及种基于Pandora的动态故障树的分析方法,属于数据处理的技术领域。该方法考虑了底事件的联系对故障树的底事件进行全局排序,在扩展SBDD算法中由底事件的全局排序以及动态底事件和静态底事件之间的关联动态删除SBDD树的无效节点以消除无效分支 |
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