Phase change memory device and manufacturing method thereof

The invention discloses a phase change memory device manufacturing method. The method comprises steps: a substrate is provided, wherein the substrate comprises an access circuit, multiple bottom electrodes arranged in an array and multiple heaters, and the top surface of each heater is exposed; a di...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
1. Verfasser: TAO YIFANG
Format: Patent
Sprache:chi ; eng
Schlagworte:
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
Beschreibung
Zusammenfassung:The invention discloses a phase change memory device manufacturing method. The method comprises steps: a substrate is provided, wherein the substrate comprises an access circuit, multiple bottom electrodes arranged in an array and multiple heaters, and the top surface of each heater is exposed; a dielectric layer is formed to cover the top surface of the heater; the dielectric layer is patterned to form multiple grooves, and the top surface of the heater is exposed via the multiple grooves; a first barrier layer is formed on one inner-side surface of the multiple grooves; a phase change material is deposited in the groove; part of the phase change material is removed to expose the first barrier layer located on one side wall of the groove; and a top electrode is formed in the groove to cover the phase change material. According to the above manufacturing method, one mask is only needed to complete manufacturing of the phase change memory device. The invention also discloses a phase change memory device. 种相变化存