Method for classifying light-emitting semiconductor components and image sensor application having an image sensor and a semiconductor element

The invention relates to a method for classifying a light-emitting semiconductor component (301) for an image sensor application, wherein the semiconductor component (301) is designed as a light source for an image sensor (302), comprising the following steps: providing the light-emitting semiconductor component (301); determining at least one of the following parameters of the light emitted with an emission spectrum by the light-emitting semiconductor component (301) during operation: R = the integral of q R ([lambda])*S([lambda])d[lambda] t exp , G = the integral of q G ([lambda])*S([lambda])d[lambda]*t exp , B = the integral of q B ([lambda])*S([lambda])d[lambda]*t exp , wherein qR([lambda]), qG([lambda]), and qB ([lambda]) are spectral sensitivities of a red, green, and blue color channel of the image sensor (302), S ([lambda]) is the emission spectrum of the light-emitting semiconductor component (301), texp is an exposure time, and [lambda] designates a wavelength; classifying the light-emitting semicon