BiCMOS integration circuit manufacturing method
The invention provides a BiCMOS integration circuit manufacturing method. The method comprises the following steps of forming a first oxide layer on a substrate surface, wherein a substrate includes a well region and a collecting area; forming a first photoresist layer on a first oxide layer surface...
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Format: | Patent |
Sprache: | chi ; eng |
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Zusammenfassung: | The invention provides a BiCMOS integration circuit manufacturing method. The method comprises the following steps of forming a first oxide layer on a substrate surface, wherein a substrate includes a well region and a collecting area; forming a first photoresist layer on a first oxide layer surface; taking the first photoresist layer as a mask film, and carrying out ion implantation on a preset area of the collecting area so as to form a first ion implantation area; removing the first photoresist layer; removing the first oxide layer; and forming a second oxide layer on the substrate surface. By using the BiCMOS integration circuit manufacturing method of the invention, a qualified rate of a BiCMOS integration circuit can be increased.
本发明提供种BiCMOS集成电路制作方法,包括:在衬底的表面形成第氧化层,衬底包括阱区和集电区;在第氧化层表面形成第光刻胶层;以第光刻胶层为掩膜,对集电区的预设区域进行离子注入,形成第离子注入区;去除第光刻胶层;去除第氧化层;在衬底的表面形成第二氧化层。本发明提供的BiCMOS集成电路制作方法,能够提高BiCMOS集成电路的合格率。 |
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