Method of determining short circuit of negative and positive electrodes of organic light-emitting diode

The invention discloses a method of determining short circuit of negative and positive electrodes of an organic light-emitting diode. The method comprises the steps: detecting whether a foreign matter exists in a sub-pixel unit of an organic light-emitting diode; if a foreign matter exists in the sub-pixel unit, disconnecting the connection between the foreign matter and the sub-pixel unit; and determining changes of the brightness state of the sub-pixel unit so as to determine whether the foreign matter causes short circuit between the negative electrode and the positive electrode of the sub-pixel unit. The method of determining short circuit of negative and positive electrodes of an organic light-emitting diode has the advantages of improving the efficiency, saving the cost, being simple in operation, and being high in accuracy/success rate. 本申请公开种判定有机发光二极管阴阳极短路的方法。该方法包括：检测所述有机发光二极管的亚像素单元是否存在异物；在检测到所述亚像素单元存在异物时，断开所述异物与所述亚像素单元之间的连接；以及判断所述亚像素单元的亮度状态变化以确定该异物是否造成在所述亚像素单元的阴极与阳极之间的短路。本申请能够提高效率、节约成本，并且操作简单、分析正确率/成