Multi-resolution Detectors For Measuring And Controlling Charged Particle Pencil Beam

A multi-resolution detector includes a high-resolution pixelated electrode and a low-resolution pixelated electrode. The high-resolution pixelated electrode includes a plurality of sub-arrays of first pixels. Each respective first pixel at each relative position in each sub-array is electrically con...

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Hauptverfasser: BOISSEAU R PAUL, OTA KA, GORDON JOHN, DART ANDREW
Format: Patent
Sprache:chi ; eng
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Zusammenfassung:A multi-resolution detector includes a high-resolution pixelated electrode and a low-resolution pixelated electrode. The high-resolution pixelated electrode includes a plurality of sub-arrays of first pixels. Each respective first pixel at each relative position in each sub-array is electrically connected in parallel with one another. The low-resolution pixelated electrode includes a plurality of second pixels. A control system receives as inputs an output from each pixelated detector. The control system uses the inputs to determine a physical position and a transverse intensity distribution of an incident charged particle pencil beam at the resolution of the high-resolution pixelated electrode. 种多分辨率检测器包括高分辨率像素化电极和低分辨率像素化电极。高分辨率像素化电极包括第像素的多个子阵列。每个子阵列中的每个相对位置处的每个分别的第像素彼此并联电连接。低分辨率像素化电极包括多个第二像素。控制系统接收作为输入的来自每个像素化检测器的输出。控制系统使用这些输入来以高分辨率像素化电极的分辨率确定入射的带电粒子笔形射束的物理位置和横向强度分布。