Lightning surge voltage test waveform adjustment method for large-capacity DC cable

The invention relates to a lightning surge voltage test waveform adjustment method for a large-capacity DC cable. Currently, conventional resistor parameter setting employs a simple empirical formula, and the overshoot rate of a test waveform cannot be controlled effectively. The method comprises the following steps: 1), obtaining a corresponding output voltage s domain expression U(s) and a time domain expression u(t) according to a lightning surge test 3-order discharge circuit of a loop inductor, and introducing a variable delta m which can represent a waveform overshoot rate; 2), minimizing wavefront time (shown in the description) as a target function, building an optimization model, solving an optimal solution of resistor parameters under a constraint condition, and constraining the waveform overshoot rate in the optimization model through limiting the size of delta m. According to the technical scheme of the invention, the variable delta m which can represent the waveform overshoot rate is introduced,