Electronic device test method and electronic device test system

The invention discloses an electronic device test method and an electronic device test system. The method is characterized in that function test is performed on a plurality of electronic devices through a host computer, wherein the test method includes that: a device description partition is newly added into a system partition of each electronic device in the plurality of electronic devices, and the device description partition is used for storing a piece of test device information of each electronic device; after the host computer is connected to each electronic device through an interface, the host computer reads the device description partition of each electronic device to generate a read result corresponding to each electronic device; it is determined if the host computer is already provided with a drive program of each electronic device or not according to the read result corresponding to each electronic device; and after it is determined that the host computer is already provided with the drive program