System for measuring cortical thickness from MR scan information

A measurement apparatus (800) to measure cortical thickness, the measurement apparatus may include at least one controller (810) which may be configured to: obtain magnetic resonance (MR) scan information of a region-of-interest of at least a portion of a cerebral cortex of a subject; form first, se...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	POPOV VELJKO, FRANZ ASTRID RUTH, WEESE JUERGEN, BREEUWER MARCEL, STEHLE THOMAS HEIKO, FLACKE SEBASTIAN, MEYER CARSTEN, ZAGORCHEV LYUBOMIR GEORGIEV, WENZEL FABIAN
Format:	Patent
Sprache:	chi ; eng
Schlagworte:	MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING
Online-Zugang:	Volltext bestellen
Tags:	Tag hinzufügen Keine Tags, Fügen Sie den ersten Tag hinzu!