System for measuring cortical thickness from MR scan information
A measurement apparatus (800) to measure cortical thickness, the measurement apparatus may include at least one controller (810) which may be configured to: obtain magnetic resonance (MR) scan information of a region-of-interest of at least a portion of a cerebral cortex of a subject; form first, se...
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Sprache: | chi ; eng |
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Zusammenfassung: | A measurement apparatus (800) to measure cortical thickness, the measurement apparatus may include at least one controller (810) which may be configured to: obtain magnetic resonance (MR) scan information of a region-of-interest of at least a portion of a cerebral cortex of a subject; form first, second and third meshes each comprising a plurality of points situated apart from each other, the first and third meshes being situated at inner and outer cortical boundary layers, respectively, of the cerebral cortex and the second mesh being situated between the first and third meshes; and/or for each of a plurality of points of the second mesh: determine a closest point of the first mesh and a closest point of the third mesh, determine a distance between the corresponding closest point of the first mesh and the corresponding closest point of the third mesh, said distance being corresponding with a cortical thickness.
种用于测量皮层厚度的测量装置(800),所述测量装置可以包括至少个控制器(810),其可以被配置为:获得对象的大脑皮层的至少部分的感兴趣区域的磁共振(MR)扫描信息;形成第网格、第二网格和第三网格 |
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