Refraction and reflection type large aperture and large field of view imaging system
The invention relates to a refraction and reflection type large aperture and large field of view imaging system. The refraction and reflection type large aperture and large field of view imaging system is characterized in that a refraction type correction plate, a reflection type primary mirror and...
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| Hauptverfasser: | , , , |
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| Format: | Patent |
| Sprache: | chi ; eng |
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| Zusammenfassung: | The invention relates to a refraction and reflection type large aperture and large field of view imaging system. The refraction and reflection type large aperture and large field of view imaging system is characterized in that a refraction type correction plate, a reflection type primary mirror and a refraction type correction mirror group are successively arranged along an optical axis from the outside to the inside; the central area of the second surface of the correction plate is plated with a reflective coating layer, and becomes a reflection type secondary mirror; an incident light beam irradiates to the reflection type primary mirror through the refraction type correction plate; the reflection type primary mirror reflects the incident light beam to the reflection type secondary mirror; and the reflection type secondary mirror reflects the light beam to the refraction type correction mirror group, and then the light beam passing through the refraction type correction mirror group is converged on a focal |
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