Irradiation meter used for xenon lamp aging oven and measuring method thereof

The invention discloses an irradiation meter used for a xenon lamp aging oven and a measuring method thereof. The irradiation meter comprises a probe and a host. The probe comprises an optical filter and a sensor module. The sensor module is connected with the host. The method comprises the steps of...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: GAO XIANG, ZHOU YANYU, SUN GENGPENG
Format: Patent
Sprache:chi ; eng
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Beschreibung
Zusammenfassung:The invention discloses an irradiation meter used for a xenon lamp aging oven and a measuring method thereof. The irradiation meter comprises a probe and a host. The probe comprises an optical filter and a sensor module. The sensor module is connected with the host. The method comprises the steps of: obtaining and selecting a corresponding waveband and a xenon lamp filtering shield type; calling calibrated and marked corresponding reference data; and calling a corresponding irradiance algorithm to calculate the irradiance according to the corresponding waveband, xenon lamp filtering shield type and corresponding reference data, and obtaining an irradiance value. According to the invention, the corresponding algorithm can be selected to calculate the irradiance according to the obtained waveband, the accuracy of the measurement can be improved greatly, the irradiance of a plurality of wavebands can be measured and the applicability is improved. The irradiation meter used for the xenon lamp aging oven and the m