Data processing method and method used for orthogonal test
The invention discloses a data processing method and method used for an orthogonal test. The method comprises following steps: acquiring test parameters divided to be switching value and analog quantity; calculating switching value in order to obtain a two-level orthogonal array and calculating anal...
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Format: | Patent |
Sprache: | chi ; eng |
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Zusammenfassung: | The invention discloses a data processing method and method used for an orthogonal test. The method comprises following steps: acquiring test parameters divided to be switching value and analog quantity; calculating switching value in order to obtain a two-level orthogonal array and calculating analog quantity in order to obtain multiple-level orthogonal array; and splicing the two-level orthogonal array and the multiple-level orthogonal array and utilizing the spliced array as a mixed orthogonal array. The problem of poor efficiency of the orthogonal test is solved by combining any parameter of the orthogonal test in the mixed orthogonal array. Therefore, the effect of the orthogonal test is improved.
本发明公开了种用于正交试验的数据处理方法和装置。该方法包括:获取试验参数;将试验参数划分为开关量和模拟量;对开关量执行计算,得到二水平正交表,并对模拟量执行计算,得到多水平正交表;对二水平正交表和多水平正交表执行拼接处理,并将拼接得到的表格作为混合正交表;通过混合正交表对试验参数中的任意参数组合执行正交试验,解决了正交试验的效率比较低的问题,进而达到了提升正交试验的效率的效果。 |
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