High-resolution scanning microscopy

The invention relates to a microscope and a method for the high-resolution scanning microscopy of a sample (2), wherein - the sample (2) is illuminated, - at least one point or line stop (14) guided over the probe (2) in a scanning manner is imaged into an individual image (17) which lies on a detection plane (18) in a stationary manner, said spot (14) being imaged into the individual image (17) in a diffraction-limited manner using an imaging scale, - the individual image (17) is detected for different scanning positions with a spatial resolution which is at least twice as large as a half-value width of the diffraction-limited individual image (17) while taking into consideration the imaging scale such that a diffraction structure of the individual image (17) is detected, - the diffraction structure of the individual image (17) is analyzed for each scanning position and an image of the sample (2) is generated, said image having a resolution which is increased over the diffraction threshold, - a detector arra