Electronic device testability modeling evaluation method

The invention discloses an electronic device testability modeling evaluation method, and relates to the technical field of device testing. The electronic device testability modeling evaluation method comprises the following steps of 1) determining the modeling object; 2) building a testability hierarchical mixture model; 3) adjusting, correcting and verifying the built testability hierarchical mixture model, and evaluating the accuracy of the built model; and 4) analyzing and evaluating the device testability. The electronic device testability modeling evaluation method has good observability, the association and dependency relation between faults and tests can be reflected, and the structural relation and the fault propagation relation between system modules can be reflected; multi-source testability information can be fused to carry out testability quantitative analysis and evaluation, at the same time, the electronic device testability modeling evaluation method has hierarchy, small fragment testability mo