C/S structure-based fabric defect detection information management system and method thereof

The invention provides a C/S structure-based fabric defect detection information management system and a method thereof. The C/S structure-based fabric defect detection information management system comprises a data acquisition system, automatic cloth inspection machines and semi-automatic cloth rep...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	CUI CHUNJIE, GONG YUE, JING HAOTIAN
Format:	Patent
Sprache:	chi ; eng
Schlagworte:	INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS TESTING
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