C/S structure-based fabric defect detection information management system and method thereof
The invention provides a C/S structure-based fabric defect detection information management system and a method thereof. The C/S structure-based fabric defect detection information management system comprises a data acquisition system, automatic cloth inspection machines and semi-automatic cloth rep...
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Format: | Patent |
Sprache: | chi ; eng |
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Zusammenfassung: | The invention provides a C/S structure-based fabric defect detection information management system and a method thereof. The C/S structure-based fabric defect detection information management system comprises a data acquisition system, automatic cloth inspection machines and semi-automatic cloth repairing machines, and each of the automatic cloth inspection machines is connected with a plurality of the semi-automatic cloth repairing machines according to a C/S network structure. The automatic cloth inspection machines automatically detect defects, and preserve defect position information in a database, the cloth repairing machines automatically stop the defects in corresponding positions of cloth repairing benches according to the obtained defect position information, and indicate concrete positions by using indicating lamps, a worker repairs the cloth and evaluates the quality of the repaired cloth in detains, and a result is preserved in the database. The system and the method greatly improve the cloth qual |
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