Thermal power set DCS analog quantity control circuit simulation test system and method
The invention relates to a thermal power set DCS analog quantity control circuit simulation test system and method. The system comprises a thermal power set excitation type simulation platform and a test DCS, wherein the thermal power set excitation type simulation platform comprises a simulation DC...
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Format: | Patent |
Sprache: | chi ; eng |
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Zusammenfassung: | The invention relates to a thermal power set DCS analog quantity control circuit simulation test system and method. The system comprises a thermal power set excitation type simulation platform and a test DCS, wherein the thermal power set excitation type simulation platform comprises a simulation DCS and a simulation model which are mutually connected, and the test DCS and the simulation model employ trunk connection; and the test DCS sends a trunk control instruction to the simulation model, and after operation of the simulation model, simultaneously sends control parameters to the test DCS and the simulation DCS so as to realize a control closed loop. Compared to the prior art, the system and method provided by the in invention have the following advantages: a dynamic simulation test of an analog quantity loop is realized, the problems existing in logic configuration are discovered and solved timely, the implementation quality of control function configuration is improved, favorable conditions are created f |
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