Functionalized grids for locating and imaging biological specimens and methods of using the same
The invention relates to functionalized grids for locating and imaging biological specimens and methods of using the same. A functionalized specimen support for use in charged particle microscopy is provided that includes a specimen support surface configured to support specimens during an interroga...
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creator | MARK W. UTLAUT N. WILLIAM PARKER |
description | The invention relates to functionalized grids for locating and imaging biological specimens and methods of using the same. A functionalized specimen support for use in charged particle microscopy is provided that includes a specimen support surface configured to support specimens during an interrogation of the specimens with a charged particle microscope, the specimen support surface having functionalized sites, each functionalized site configured to maintain position of a portion of one of the specimens at the functionalized site by way of attachment, attraction, or a combination thereof. |
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WILLIAM PARKER</creatorcontrib><description>The invention relates to functionalized grids for locating and imaging biological specimens and methods of using the same. A functionalized specimen support for use in charged particle microscopy is provided that includes a specimen support surface configured to support specimens during an interrogation of the specimens with a charged particle microscope, the specimen support surface having functionalized sites, each functionalized site configured to maintain position of a portion of one of the specimens at the functionalized site by way of attachment, attraction, or a combination thereof.</description><language>eng</language><subject>BASIC ELECTRIC ELEMENTS ; ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS ; ELECTRICITY ; INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES ; MEASURING ; PHYSICS ; TESTING</subject><creationdate>2016</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20160210&DB=EPODOC&CC=CN&NR=105319226A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25562,76317</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20160210&DB=EPODOC&CC=CN&NR=105319226A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>MARK W. UTLAUT</creatorcontrib><creatorcontrib>N. WILLIAM PARKER</creatorcontrib><title>Functionalized grids for locating and imaging biological specimens and methods of using the same</title><description>The invention relates to functionalized grids for locating and imaging biological specimens and methods of using the same. A functionalized specimen support for use in charged particle microscopy is provided that includes a specimen support surface configured to support specimens during an interrogation of the specimens with a charged particle microscope, the specimen support surface having functionalized sites, each functionalized site configured to maintain position of a portion of one of the specimens at the functionalized site by way of attachment, attraction, or a combination thereof.</description><subject>BASIC ELECTRIC ELEMENTS</subject><subject>ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS</subject><subject>ELECTRICITY</subject><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</subject><subject>MEASURING</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2016</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNqNyzEOwjAMheEuDAi4gzkAEm0FEiOqqJiY2ItJ3NRSEkd1unB6KOIATO8fvrcsHu0UTWaJ6PlFFtzIVqGXEbwYzBwdYLTAAd3cTxYvjg160ESGA0X9gkB5kM9Teph0lnkgUAy0LhY9eqXNb1fFtr3cm-uOknSkCQ1Fyl1zK_eHujxV1fFc_2Pe1xg9RQ</recordid><startdate>20160210</startdate><enddate>20160210</enddate><creator>MARK W. UTLAUT</creator><creator>N. WILLIAM PARKER</creator><scope>EVB</scope></search><sort><creationdate>20160210</creationdate><title>Functionalized grids for locating and imaging biological specimens and methods of using the same</title><author>MARK W. UTLAUT ; N. WILLIAM PARKER</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_CN105319226A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2016</creationdate><topic>BASIC ELECTRIC ELEMENTS</topic><topic>ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS</topic><topic>ELECTRICITY</topic><topic>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</topic><topic>MEASURING</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>MARK W. UTLAUT</creatorcontrib><creatorcontrib>N. WILLIAM PARKER</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>MARK W. UTLAUT</au><au>N. WILLIAM PARKER</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Functionalized grids for locating and imaging biological specimens and methods of using the same</title><date>2016-02-10</date><risdate>2016</risdate><abstract>The invention relates to functionalized grids for locating and imaging biological specimens and methods of using the same. A functionalized specimen support for use in charged particle microscopy is provided that includes a specimen support surface configured to support specimens during an interrogation of the specimens with a charged particle microscope, the specimen support surface having functionalized sites, each functionalized site configured to maintain position of a portion of one of the specimens at the functionalized site by way of attachment, attraction, or a combination thereof.</abstract><oa>free_for_read</oa></addata></record> |
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subjects | BASIC ELECTRIC ELEMENTS ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS ELECTRICITY INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS TESTING |
title | Functionalized grids for locating and imaging biological specimens and methods of using the same |
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