Functionalized grids for locating and imaging biological specimens and methods of using the same

The invention relates to functionalized grids for locating and imaging biological specimens and methods of using the same. A functionalized specimen support for use in charged particle microscopy is provided that includes a specimen support surface configured to support specimens during an interroga...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser:	MARK W. UTLAUT, N. WILLIAM PARKER
Format:	Patent
Sprache:	eng
Schlagworte:	BASIC ELECTRIC ELEMENTS ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS ELECTRICITY INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS TESTING
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Beschreibung
Zusammenfassung:	The invention relates to functionalized grids for locating and imaging biological specimens and methods of using the same. A functionalized specimen support for use in charged particle microscopy is provided that includes a specimen support surface configured to support specimens during an interrogation of the specimens with a charged particle microscope, the specimen support surface having functionalized sites, each functionalized site configured to maintain position of a portion of one of the specimens at the functionalized site by way of attachment, attraction, or a combination thereof.