Test method and automatic test equipment using the test method
The invention discloses a test method. The method is used in automatic test equipment and is used for testing a plurality of pins to be tested of an object to be tested. The automatic test equipment possesses a plurality of test groups. Each test group possesses a plurality of pin test units which c...
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Format: | Patent |
Sprache: | eng |
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Zusammenfassung: | The invention discloses a test method. The method is used in automatic test equipment and is used for testing a plurality of pins to be tested of an object to be tested. The automatic test equipment possesses a plurality of test groups. Each test group possesses a plurality of pin test units which correspond to one analogy analog-to-digital converter respectively. The test method comprises the following steps that a first control unit determines a reading value sorting table of each test group according to a selection signal; the first control unit loads test parameters of pin test units according to the reading value sorting table; the pin test units repeatedly carry out a pin test on the pins to be tested according to the test parameters so as to acquire a plurality of test signals; the analogy analog-to-digital converter converts a test signal into a test value; a second control unit acquires a plurality of test values and a calculating unit calculates an average value of the test values. |
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