Short circuit test circuit three-phase asymmetric impedance determination method

The invention discloses a short circuit test circuit three-phase asymmetric impedance determination method, comprising steps of establishing a phase component model of each electric member in a test circuit, constructing a phase network equation of a test circuit according to the phase component model, analyzing three-phase asymmetric impedance of the test circuit, performing the short circuit test on the test circuit and determining the three-phase asymmetric impedance value of the electric member in the test circuit according to the phase network equation. Compared with the prior art, the short circuit test circuit three-phase asymmetric impedance determination method disclosed by the invention can accurately determine the adjusting impedance value of each of the three phases, reduces the times of the tests, improves the test accuracy and the test result credibility, saves the test resources and improves the test device utilization rates.