High-precision measuring method for surface shape and distance of oversize space structure

The invention provides a high-precision measuring method for a surface shape and a distance of an oversize space structure. The method includes the steps: 1, controlling a laser radar scanner to scan a to-be-measured structure through a servo motor, and obtaining polar coordinates data (R, [gamma],...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: WANG SHU'NAN, WANG ZHIGUO, FANG WUDI, REN YOULIANG, YANG YONG, MAN XIAOYING, PENG HAIKUO, LIN DEGUI
Format: Patent
Sprache:eng
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Beschreibung
Zusammenfassung:The invention provides a high-precision measuring method for a surface shape and a distance of an oversize space structure. The method includes the steps: 1, controlling a laser radar scanner to scan a to-be-measured structure through a servo motor, and obtaining polar coordinates data (R, [gamma], [theta]) of all scanning points on the to-be-measured structure; 2, converting the polar coordinates data of the scanning points into rectangular coordinate system data, and forming surface shape information of the to-be-measured structure; 3, fitting an equivalent plane according to the rectangular coordinate system data; and 4, obtaining distance information and space angle of inclination information of the to-be-measured structure according to the equivalent plane. The measuring method can measure a surface shape and a distance of an oversize space structure in a highly precise manner, and therefore subsequent adjusting and control can be achieved conveniently.