Heavy ion irradiation testing system for signal processing platform

The invention provides a heavy ion irradiation testing system for a signal processing platform. The system comprises a host computer which is used for data receiving, processing, storing and displaying and test process control, a power supply management unit which comprises a programmable power supply, an FPGA+DSP signal processing unit and a manage test unit. The programmable power supply is connected with the host computer, is used for powering the whole system, and feeds back the current of the system and devices to the host computer. The FPGA+DSP signal processing unit is used as a typical space application load signal processing platform, wherein FPGA is SRAM-FPGA and is used as a tested unit of a heavy ion irradiation test. The manage test unit comprises an FPGA and is used for system configuration, data acquisition and exceptional control in the test process. The system provided by the invention has the advantages of flexible architecture, flexible tested object, multiple test items, fast data transmission and the like.