Method evaluating black fungus mycelium high temperature resistance feature

The invention discloses a method evaluating a black fungus mycelium high temperature resistance feature and relates to an evaluating method for a black fungus high temperature resistance feature. The method is to provide a method with high feasibility and capable of simply and quickly identifying an...

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Hauptverfasser: KONG XIANGHUI, HAN ZENGHUA, MA YINPENG, ZHANG JIECHI, ZHANG PIQI, LIU JIANING, DAI XIAODONG, MA QINGFANG, CHEN HE
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creator KONG XIANGHUI
HAN ZENGHUA
MA YINPENG
ZHANG JIECHI
ZHANG PIQI
LIU JIANING
DAI XIAODONG
MA QINGFANG
CHEN HE
description The invention discloses a method evaluating a black fungus mycelium high temperature resistance feature and relates to an evaluating method for a black fungus high temperature resistance feature. The method is to provide a method with high feasibility and capable of simply and quickly identifying and affirming black fungus types whether to have a high-temperature resistant feature. The evaluating method comprises the following steps of (1) manufacturing a panel or an inclined surface via cPDA culture medium, (2) introducing black fungus into the cPDA inclined surface or the cPDA panel and culturing the black fungus for 96 hours at the temperature of 25 DEG C, (3) placing the black fungus at the temperature of 60 DEG C and conducting heat shock to the black fungus for 2 hours, and (4) placing the black fungus at the temperature of 25 DEG C. The mycelium continues to grow or restore growth and then the black fungus mycelium high temperature resistance feature is affirmed. The method is applied to evaluation of the black fungus high temperature resistance feature.
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subjects AGRICULTURE
ANIMAL HUSBANDRY
CULTIVATION OF VEGETABLES, FLOWERS, RICE, FRUIT, VINES, HOPSOR SEAWEED
FISHING
FORESTRY
HORTICULTURE
HUMAN NECESSITIES
HUNTING
TRAPPING
WATERING
title Method evaluating black fungus mycelium high temperature resistance feature
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