Method and device for measuring and optimising an optoelectronic component

Method and device for measuring and optimising an optoelectronic component

The invention relates to a method for measuring at least one optoelectronic component (10) arranged on a connection carrier (100). The method comprises steps of exciting an electromagnetic oscillating circuit (38, 39), which is formed by the optoelectronic component (10) and the connection carrier (...

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Hauptverfasser: OBERSCHMID RAIMUND, VOGL ANTON, SCHULZ ROBERT, ZEISEL ROLAND, DIETZ MICHAEL
Format: Patent
Sprache:eng
Schlagworte:
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
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creator OBERSCHMID RAIMUND
VOGL ANTON
SCHULZ ROBERT
ZEISEL ROLAND
DIETZ MICHAEL
description The invention relates to a method for measuring at least one optoelectronic component (10) arranged on a connection carrier (100). The method comprises steps of exciting an electromagnetic oscillating circuit (38, 39), which is formed by the optoelectronic component (10) and the connection carrier (100), thus exciting the optoelectronic component (10) in such a way that the optoelectronic component emits electromagnetic radiation (70), and measuring at least one electro-optical property of the optoelectronic component (10).
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subjects MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
title Method and device for measuring and optimising an optoelectronic component
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